Features
1.The instrument is smaller, lighter and easier to carry.
2.High-speed processing chips, advanced algorithms and efficient software work together to make instrument analysis faster.
3.The selection of imported high-performance X-ray emitting tubes and ultra-high-resolution detectors, combined with digital
4.multi-channel processing technology, makes TrueX handheld X-fluorescence spectrometers have ultra-high analytical accuracy.
5.Users can customize the creation of professional reports: including company logo, company address, test results, spectrogram and
6.other sample information (such as product description, origin, lot number, etc.).
7.Built-in all-round environmental sensing system. This enables TrueX to sense changes in the surrounding environment in real time
8.and automatically make parameter adjustments to accurate elemental analysis under extreme conditions such as high and low
9.temperatures, dust, darkness and dampness.
10.Built-in DoubleBeam™ technology automatically senses the presence or absence of samples in front of the instrument, improving
11.the safety and protection level of the ray. And automatically adjust the display brightness according to the brightness of the external
12.environment.
13.The device can be connected to the Internet, and the instrument can be set up and overhauled remotely.
14.TrueX's built-in new net strength fitting algorithm optimizes the spectral resolution process, giving TrueX extremely low detection
15.limits comparable to large lab equipment.
16.Smart battery with MSBUS bus, real-time monitoring battery, backup battery can directly view the remaining capacity of the battery.
17.Compared to capacitive screen with better backlight performance, industrial resistive touch screen is still clearly visible in the field of
18.strong light, while eliminating the risk of glove removal in special environments in the field.
Principles and characteristics of X-ray fluorescence analysis
The sample is bombarded with X-rays, and the sample is excited to produce X-ray fluorescence, which usually punches the electrons in the inner layers of the K and L layers of the elemental atom layers out of the atoms, and the holes created are filled by high-energy outer electrons. High-energy electrons supplemented into low-energy orbits radiate excess energy in X-ray fluorescence. These radiated spectral lines contain the characteristics of various elements, like fingerprints, and are independent of the chemical valence state of the atom. The intensity of radiation is proportional to the concentration of this element in the samples.