Excitation Principle
DW-EDX3000 uses X-ray beam from X-ray tube to irradiate the sample, and the element atoms will be excited and emit the secondary X-ray fluorescence characteristic for its own energy. Then these elements get identified and its content measured. The working principle is as follows:
Characteristic X-radiation of element
Each element will emit X-ray at its own energy level when excited. This X-ray is characteristic and called X-ray fluorescence. It is the foundation of analysis.
Scattering
It is the background of spectrum.
Photoelement
The photoelectron is the foundation of detector. In the sample, the X-ray intensity of every element is expressed as I1,I2,I3,I4,I5......respectively. The clement content C is the function of X-ray fluorescence intensity I, expressed as follows:
(I1,I2+I3+I4+I5……)
This equation is too complicated and can be simplified as:
C=KlI1+KI2+KI3+K4I4+K5I5……
Where
C is the element content in the sample; I1,I2,I3,I4,I5......arc X-ray intensity of element respectively; K1,K2, K3.K4,K5 are coefficients which can be determined by measuring known standard sample to calibrate.